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專利授權區
專利名稱(英)	RAMAN DETECTING CHIP, METHOD OF FABRICATING THE SAME AND RAMAN SPETROSCOPY DETECTING SYSTEM USING SUCH RAMAN DETECTING CHIP
專利家族	中華民國：I800366 美國：US 2023-0349763 A1(公開號)
專利權人	國立清華大學 100.00%
發明人	嚴大任,林韋丞,李煥晶
技術領域	光電光學,材料化工

專利摘要(英)
A Raman detecting chip, a method of fabricating the same and a Raman spectroscopy detecting system using such Raman detecting chip are disclosed. The Raman detecting chip according to the invention includes a substrate, a plurality of nanowires and a plurality of three-dimensional dendritic metal nanostructures. The substrate has a recess. The recess has a circular opening and a circular bottom surface. The plurality of nanowires are formed on the circular bottom surface and protrude upwards. The plurality of three-dimensional dendritic metal nanostructures are formed on a plurality of tops of the plurality of nanowires and extend beyond the circular opening.

專利摘要(英)

A Raman detecting chip, a method of fabricating the same and a Raman spectroscopy detecting system using such Raman detecting chip are disclosed. The Raman detecting chip according to the invention includes a substrate, a plurality of nanowires and a plurality of three-dimensional dendritic metal nanostructures. The substrate has a recess. The recess has a circular opening and a circular bottom surface. The plurality of nanowires are formed on the circular bottom surface and protrude upwards. The plurality of three-dimensional dendritic metal nanostructures are formed on a plurality of tops of the plurality of nanowires and extend beyond the circular opening.

聯絡資訊
承辦人姓名	黃允恬
承辦人電話	(03)571-5131#62305
承辦人Email	yuntian@mx.nthu.edu.tw