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專利授權區
專利名稱(英)	Method and System for Non-Contact Temperature Measurement of Spot on Target Object
專利家族	大陸：CN118362211A(公開號) 美國：(公開號)
專利權人	國立清華大學 100.00% ,國立清華大學 100.00%
發明人	曹哲之,林國興
技術領域	光電光學

專利摘要(英)
A method, which is applied for non-contact temperature measurement of a spot on a target object, includes the following steps: image a thermal image of a target area on the target object and projecting the thermal image to an image plane; select an image spot in the image plane corresponding to the spot to allow corresponding light rays to pass through, while blocking all the rest of the light rays; measure a thermal radiation strength of the corresponding to light rays; and determine a temperature from the measured thermal radiation strength according to a calibration relation. A system of performing the above method is also provided.

專利摘要(英)

A method, which is applied for non-contact temperature measurement of a spot on a target object, includes the following steps: image a thermal image of a target area on the target object and projecting the thermal image to an image plane; select an image spot in the image plane corresponding to the spot to allow corresponding light rays to pass through, while blocking all the rest of the light rays; measure a thermal radiation strength of the corresponding to light rays; and determine a temperature from the measured thermal radiation strength according to a calibration relation. A system of performing the above method is also provided.

聯絡資訊
承辦人姓名	楊慧敏
承辦人電話	(03)571-5131 #31181
承辦人Email	hmyang@mx.nthu.edu.tw