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專利授權區
專利名稱(中) Discontinuous Type Layer-ID Detector for 3D-IC and Method of the Same
專利名稱(英) 三維晶片之不連續型態層識別編號檢測及其方法
專利家族 中華民國:I425356
大陸:1495785
美國:8,564,305
專利權人 國立清華大學 100%
發明人 吳威震,陳銘斌,張孟凡
技術領域 電子電機
專利摘要(中)
A 3D-IC detector for each layer of a stacked device with N layer, includes a dividing-two circuit coupled to a (N-1) signal; a first comparator is coupled to the dividing-two circuit, wherein an input A is coupled to an initial layer number signal, an input B of the first comparator is coupled to an output of the dividing-two circuit; a second comparator is coupled to the initial layer number by an input A of the second comparator, and a num is coupled to an input B of the second comparator; a first Add/sub circuit is coupled to the num via an input A of the first Add/sub circuit, and coupled to the first comparator via an input B of the first Add/sub circuit, to the second comparator via an input +/- signal of the first Add/sub circuit; and a second Add/sub circuit coupled to the first comparator via an input A of the second Add/sub circuit, to the num via an input B of the second Add/sub circuit.
聯絡資訊
承辦人姓名 李曉琪
承辦人電話 03-5715131 #31061
承辦人Email hsiaochi@mx.nthu.edu.tw
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