搜尋專利授權區
關鍵字
選單
專利授權區


專利授權區
專利名稱(中) 基於影像尺的定位量測系統
專利名稱(英) POSITIONING AND MEASURING SYSTEM BASED ON IMAGE SCALE
專利家族 中華民國:I628415
大陸:4656862
美國:10,535,157
專利權人 國立清華大學 100.00%
發明人 吳佑鎮,潘威丞,蔡宏營
技術領域 光電光學,資訊工程,機械結構
專利摘要(中)
一種基於影像尺的定位量測系統包含:一影像尺,用於承載一物件,影像尺具有排列成二維陣列的多個定位符號組及多個編碼圖案組,各定位符號組包含多個定位符號,各編碼圖案組包含多個編碼圖案,此等編碼圖案分別位於此等定位符號之間的空隙中;一影像擷取器,擷取物件的多個量測點與影像尺以獲得多個複合影像;一處理器,對此等複合影像進行影像處理,依據此等編碼圖案及此等定位符號以求出此等量測點的位置關係;以及一驅動機構,電連接至處理器,並機械連接至影像擷取器或影像尺,以造成影像擷取器與影像尺的相對移動。
專利摘要(英)
A positioning and measuring system comprises: an image scale supporting an object and having positioning mark sets and encoding pattern sets arranged in a two-dimensional array, each positioning mark set comprising positioning marks, each encoding pattern set comprising encoding patterns disposed in gaps between the positioning marks; an image capturing device capturing measurement points of the object and the image scale to obtain composite images; a processor processing the composite images, and determining a position relationship between the measurement points according to the encoding patterns and the positioning marks; and a driving mechanism electrically connected to the processor and mechanically connected to the image capturing device or the image scale to drive one of the image capturing device and the image scale to move relatively to the other of the image capturing device and the image scale.
聯絡資訊
承辦人姓名 楊慧敏
承辦人電話 (03)571-5131 #31181
承辦人Email hmyang@mx.nthu.edu.tw
我有興趣 BACK