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專利授權區
專利名稱(中) 複合量子點,其製作方法,及金屬離子檢測方法
專利名稱(英) COMPOSITE QUANTUM DOT, METHOD FOR PREPARING THE SAME, AND METHOD FOR DETECTING METAL ION USING THE SAME
專利家族 中華民國:I765756
美國:US2024/0132775A1(公開號)
專利權人 國立清華大學 100%
發明人 陳學仕,陳品如
技術領域 材料化工
專利摘要(英)
A composite quantum dot includes a quantum dot and a protecting unit. The quantum dot includes a dot body containing a first layer having a composition of M1A1, and a passivating unit containing a passivating metal ion and bound to the dot body. M1 is one of Zn, Sn, Pb, Cd, In, Ga, Ge, Mn, Co, Fe, Al, Mg, Ca, Sr, Ba, Ni, Ag, Ti and Cu, and A1 is one of Se, S, Te, P, As, N, I and O. The protecting unit adsorbs on the quantum dot and includes an amine compound and/or a primary ammonium salt thereof. A method for preparing the composite quantum dot and a method for detecting metal ions in an analyte aqueous solution using the composite quantum dot, as well as a passivated quantum dot and a preparation thereof, are also disclosed.
聯絡資訊
承辦人姓名 楊美茹
承辦人電話 03-5715131 #62305
承辦人Email mjyang2@mx.nthu.edu.tw
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