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專利授權區
專利名稱(中)	微波繞射系統
專利名稱(英)	Microwave Diffraction System
專利家族	美國：8,552,743
專利權人	國立清華大學 100%
發明人	袁景濱,張存續
技術領域	電子電機

專利摘要(中)
A microwave diffraction system includes two plates, a lattice model, a transmitter and a detector. The two plates are electrically conductive and configured in a parallel manner so as to form a planar waveguide. The lattice model includes a plurality of cylinders arranged in regular order and is placed between the two plates. The transmitter is arranged at an outside edge of the planar waveguide and configured for providing a microwave towards the lattice model. The detector is arranged at outside edge of the planar waveguide and configured for detecting the microwave reflected from the lattice model. The diffraction pattern obtained by the above-mentioned microwave diffraction system is similar to theoretical value.

專利摘要(中)

A microwave diffraction system includes two plates, a lattice model, a transmitter and a detector. The two plates are electrically conductive and configured in a parallel manner so as to form a planar waveguide. The lattice model includes a plurality of cylinders arranged in regular order and is placed between the two plates. The transmitter is arranged at an outside edge of the planar waveguide and configured for providing a microwave towards the lattice model. The detector is arranged at outside edge of the planar waveguide and configured for detecting the microwave reflected from the lattice model. The diffraction pattern obtained by the above-mentioned microwave diffraction system is similar to theoretical value.

聯絡資訊
承辦人姓名	鍾弦靜