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專利名稱(中) 光學材料應力量測方法及其系統
專利名稱(英) STRESS MEASUREMENT METHOD AND SYSTEM FOR OPTICAL MATERIALS
專利家族 中華民國:I619933
大陸:4098883
日本:6352495
美國:10,067,012
專利權人 國立清華大學 100.00%
發明人 陳柏宇,葉祐良,宋泊錡,呂正雍,王偉中
技術領域 機械結構,光電光學
專利摘要(中)
A stress measurement method is provided of the present disclosure. The stress measurement method includes an image capturing procedure, a phase shift calculation procedure, an isochromatic intensifying procedure and a transformation procedure. The image capturing procedure is used to capture four light intensity images with four different phase angles of a sample. The phase shift calculation procedure is used to obtain an isochromatic retardation of the sample when the four light intensity images have sufficient light intensity values. The isochromatic intensifying procedure is used to calculate two enhanced light intensity values, the background of intensified isochromatic light intensity value and the amplitude of intensified isochromatic light intensity value to obtain an isochromatic retardation when the sample is in a low stress condition. The transformation procedure is used to transform the isochromatic retardation to a stress value of the sample.
聯絡資訊
承辦人姓名 劉千綺
承辦人電話 03-571-5131 #31181
承辦人Email chienchi@mx.nthu.edu.tw
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