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專利授權區
專利名稱(中) 量化材料未知應力與殘餘應力之裝置及其方法
專利名稱(英) APPARATUS FOR QUANTIFYING UNKNOWN STRESS AND RESIDUAL STRESS OF A MATERIAL AND METHOD THEREOF
專利家族 中華民國:I457550
大陸:1460567
美國:8,780,348
專利權人 國立清華大學 100.00%
發明人 宋泊錡,王偉中,賴冠廷,黃吉宏,陳維仁
技術領域 機械結構,工業工程,光電光學
專利摘要(中)
An apparatus for quantifying unknown stress and residual stress of a material to be tested, the material being a birefringent or temporary birefringent material, which includes a light source, a polarizer in front of the light source for converting a light beam from the light source into a beam with linear polarization, a first quarter-wave plate in front of the polarizer for generating circular polarization, a standard material, a second quarter-wave plate, an analyzer, a loading unit, a spectrometer for obtaining transmissivity spectrum of the standard material under the wavelength of the light source and a detecting module connected to the spectrometer to have the transmissivity spectrum of the material to be tested and consequently a stress quantifying formula for the standard material.
聯絡資訊
承辦人姓名 劉千綺
承辦人電話 03-571-5131 #31181
承辦人Email chienchi@mx.nthu.edu.tw
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