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專利授權區
專利名稱(中)	利用人工智慧多工影像辨識技術強化矽光子晶圓出口端光斑的耦光品質之系統及其方法
專利名稱(英)	SYSTEM AND METHOD OF ENHANCING COUPLING QUALITY OF LIGHT SPOTS AT OUTPUT END OF SILICON PHOTONIC WAFERS USING ARTIFICIAL INTELLIGENCE MULTITASK IMAGE RECOGNITION
專利家族	中華民國：I896497
專利權人	國立清華大學 100.00%
發明人	葉維彰,黃郁翔,趙芙涵
技術領域	光電光學

專利摘要(中)
本發明提供一種利用人工智慧多工影像辨識技術強化矽光子晶圓出口端光斑的耦光品質之方法，包含光斑成像採集步驟、影像預處理步驟、光斑分割與特徵提取步驟、強度判讀模型建立步驟、模型訓練與測試步驟及實際應用步驟。其可將關鍵特徵與光斑的光強度建立映射關係，以建立強度判讀模型；及依據訓練數據集訓練強度判讀模型，並依據測試數據集測試強度判讀模型，以得到具人工智慧之經訓練測試強度判讀模型，經訓練測試強度判讀模型用以判讀新的光斑影像。藉此，結合光學成像和人工智能算法，提供快速、準確及非接觸式的光強度測量新途徑。

專利摘要(中)

本發明提供一種利用人工智慧多工影像辨識技術強化矽光子晶圓出口端光斑的耦光品質之方法，包含光斑成像採集步驟、影像預處理步驟、光斑分割與特徵提取步驟、強度判讀模型建立步驟、模型訓練與測試步驟及實際應用步驟。其可將關鍵特徵與光斑的光強度建立映射關係，以建立強度判讀模型；及依據訓練數據集訓練強度判讀模型，並依據測試數據集測試強度判讀模型，以得到具人工智慧之經訓練測試強度判讀模型，經訓練測試強度判讀模型用以判讀新的光斑影像。藉此，結合光學成像和人工智能算法，提供快速、準確及非接觸式的光強度測量新途徑。

專利摘要(英)
A method of enhancing coupling quality of light spots at an output end of silicon photonic wafers using artificial intelligence multitask image recognition is proposed. The method includes performing a light spot image capturing step, an image preprocessing step, a light spot segmentation and feature extraction step, an intensity determining model establishing step, a model training and testing step and a practical application step. The intensity determining model establishing step includes establishing a mapping relationship between key features and light intensities of the light spots to establish an intensity determining model. The model training and testing step includes training the intensity determining model based on a training data set and testing the intensity determining model based on a testing data set to obtain a trained and tested intensity determining model with artificial intelligence. The trained and tested intensity determining model is configured to determine a new light spot image. Therefore, the present disclosure can combine an optical imaging technique and an artificial intelligence algorithm to provide a new way of faster, more accurate and non-contact light intensity measurement.

專利摘要(英)

A method of enhancing coupling quality of light spots at an output end of silicon photonic wafers using artificial intelligence multitask image recognition is proposed. The method includes performing a light spot image capturing step, an image preprocessing step, a light spot segmentation and feature extraction step, an intensity determining model establishing step, a model training and testing step and a practical application step. The intensity determining model establishing step includes establishing a mapping relationship between key features and light intensities of the light spots to establish an intensity determining model. The model training and testing step includes training the intensity determining model based on a training data set and testing the intensity determining model based on a testing data set to obtain a trained and tested intensity determining model with artificial intelligence. The trained and tested intensity determining model is configured to determine a new light spot image. Therefore, the present disclosure can combine an optical imaging technique and an artificial intelligence algorithm to provide a new way of faster, more accurate and non-contact light intensity measurement.

聯絡資訊
承辦人姓名	黃允恬
承辦人電話	(03)571-5131#62305
承辦人Email	yuntian@mx.nthu.edu.tw