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專利授權區


專利授權區
專利名稱(中) 樣品分離用晶片、樣品檢測裝置及樣品檢測方法
專利名稱(英) CHIP FOR SAMPLE SEPARATION, SAMPLE DETECTION DEVICE AND SAMPLE DETECTION METHOD
專利家族 中華民國:I807273
大陸:CN 115078050 A(公開號)
美國:US-2022-0291090-A1(公開號)
專利權人 國立清華大學 100.00%
發明人 曾繁根,陳冠宏
技術領域 材料化工,生化醫藥
專利摘要(中)
一種樣品分離用晶片,包括第一基板、第一電極、第一介電層、第二基板、第二電極、第二介電層與流道層。第一電極設置在第一基板上。第一介電層設置在第一電極上,且包括第一開口。第一開口暴露出第一電極的一部分。第二電極設置在第二基板上。第二介電層設置在第二電極上,且包括第二開口。第二開口暴露出第二電極的一部分。第一開口所暴露出的第一電極的面積小於第二開口所暴露出的第二電極的面積。流道層夾設於第一介電層與第二介電層之間,且包括貫孔。貫孔連通於第一開口與第二開口之間。
專利摘要(英)
A chip for sample separation including a first substrate, a first electrode, a first dielectric layer, a second substrate, a second electrode, a second dielectric layer, and a flow channel layer is provided. The first electrode is disposed on the first substrate. The first dielectric layer is disposed on the first electrode and includes a first opening. The first opening exposes a portion of the first electrode. The second electrode is disposed on the second substrate. The second dielectric layer is disposed on the second electrode and includes a second opening. The second opening exposes a portion of the second electrode. An area of the first electrode exposed by the first opening is smaller than an area of the second electrode exposed by the second opening. The flow channel layer is sandwiched between the first dielectric layer and the second dielectric layer and includes a through hole. The through hole communicates between the first opening and the second opening.
聯絡資訊
承辦人姓名 楊美茹
承辦人電話 03-5715131 #62305
承辦人Email mjyang2@mx.nthu.edu.tw
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