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專利授權區
專利名稱(中)	拉曼檢測晶片、其製造方法及運用該拉曼檢測晶片之拉曼光譜檢測系統
專利名稱(英)	RAMAN DETECTING CHIP, METHOD OF FABRICATING THE SAME AND RAMAN SPETROSCOPY DETECTING SYSTEM USING SUCH RAMAN DETECTING CHIP
專利家族	中華民國：I800366
專利權人	國立清華大學 100%
發明人	嚴大任,林韋丞,李煥晶
技術領域	材料化工,光電光學

專利摘要(英)
A Raman detecting chip, a method of fabricating the same and a Raman spectroscopy detecting system. The Raman detecting chip according to the invention includes a substrate, a plurality of nano-wires and a plurality of three-dimensional dendritic metal nanostructures. The substrate has an access. The access has a circular opening and a circular bottom surface. The plurality of nona-wires are formed on the circular bottom surface and protrude upward. The plurality of three-dimensional dendritic metal nanostructures are formed on a plurality of tops of the plurality of nanowires and extend beyond the circular opening.

專利摘要(英)

A Raman detecting chip, a method of fabricating the same and a Raman spectroscopy detecting system. The Raman detecting chip according to the invention includes a substrate, a plurality of nano-wires and a plurality of three-dimensional dendritic metal nanostructures. The substrate has an access. The access has a circular opening and a circular bottom surface. The plurality of nona-wires are formed on the circular bottom surface and protrude upward. The plurality of three-dimensional dendritic metal nanostructures are formed on a plurality of tops of the plurality of nanowires and extend beyond the circular opening.

聯絡資訊
承辦人姓名	楊美茹
承辦人電話	03-5715131 #62305
承辦人Email	mjyang2@mx.nthu.edu.tw