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專利授權區

專利授權區
專利名稱(中)	奈米探針結構及其應用
專利名稱(英)	NANOSCALE PROBE STRUCTURE AND APPLICATION THEREOF
專利家族	美國：US 9,354,250
專利權人	國立清華大學 100%
發明人	陳怡全,曾繁根
技術領域	材料化工,生化醫藥,能源科技

專利摘要(中)
A nanoscale probe structure, including: a first probe having a tip top end and a second probe having a planar top end, wherein a metallic layer coats the on the tip top end, an insulating layer coats around the tip top end of the first probe; and a metallic layer coats on the planar top end, an insulating layer coats around the planar top end of the second probe. The structure of present invention can applied in atomic force microscopy to measure the electricity physiology signal inside and outside the cell membrane, which can limit the measure region to specific little area for the measure of electricity physiology signal and effectively decrease the miscellaneous noise disturbance from other region.

專利摘要(中)

A nanoscale probe structure, including: a first probe having a tip top end and a second probe having a planar top end, wherein a metallic layer coats the on the tip top end, an insulating layer coats around the tip top end of the first probe; and a metallic layer coats on the planar top end, an insulating layer coats around the planar top end of the second probe. The structure of present invention can applied in atomic force microscopy to measure the electricity physiology signal inside and outside the cell membrane, which can limit the measure region to specific little area for the measure of electricity physiology signal and effectively decrease the miscellaneous noise disturbance from other region.

聯絡資訊
承辦人姓名	鍾弦靜