搜尋專利授權區
關鍵字
選單
專利授權區


專利授權區
專利名稱(英) DETECTION USING SEMICONDUCTOR DETECTOR
專利家族 中華民國:I782474
大陸:CN113539873A(公開號)
美國:2021-0407764(公開號)
專利權人 國立清華大學 66.67% ,台灣積體電路製造股份有限公司 33.33%
發明人 金雅琴,林崇榮,林本堅,王建評,王紹華,張俊霖,陳立銳
技術領域 電子電機
專利摘要(英)
A method includes applying a first voltage to a source of a first transistor of a detector unit of a semiconductor detector in a test wafer and applying a second voltage to a gate of the first transistor and a drain of a second transistor of the detector unit. The first transistor is coupled to the second transistor in series, and the first voltage is higher than the second voltage. A pre-exposure reading operation is performed to the detector unit. Light of an exposure apparatus is illuminated to a gate of the second transistor after applying the first and second voltages. A post-exposure reading operation is performed to the detector unit. Data of the pre-exposure reading operation is compared with the post-exposure reading operation. An intensity of the light is adjusted based on the compared data of the pre-exposure reading operation and the post-exposure reading operation.
聯絡資訊
承辦人姓名 李曉琪
承辦人電話 03-5715131 #31061
承辦人Email hsiaochi@mx.nthu.edu.tw
我有興趣 BACK