專利授權區 | |
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專利名稱(英) | WAFER WITH HIGH RUPTURE RESISTANCE |
專利家族 |
中華民國:I473283 大陸:1364383 美國:9,379,262 |
專利權人 | 國立清華大學 100% |
發明人 | 葉哲良 |
技術領域 | 材料化工,能源科技 |
專利摘要(中) |
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A wafer with high rupture resistance includes a plurality of surfaces, wherein the surfaces include a largest surface having a largest area than others and a side surface connected to the fringe of the largest surface. The side surface forms a nanostructured layer thereon to assist the stress dispersion of the wafer. Accordingly, the wafer is provided with a high rupture resistance so as to prevent the wafer from damages during semiconductor or other processes. |
聯絡資訊 | |
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承辦人姓名 | 劉千綺 |
承辦人電話 | 03-571-5131 #31181 |
承辦人Email | chienchi@mx.nthu.edu.tw |