A fabricating method of a resistive random access memory unit with one-way conduction characteristic is proposed. The fabricating method of the resistive random access memory unit with one-way conduction characteristic includes performing an initializing step, a forming step and a reverse resetting step. The initializing step is performed to provide the resistive random access memory unit. The resistive random access memory unit includes an upper metal layer, a via and a lower metal layer. The upper metal layer is connected to the via, and a gap is between the lower metal layer and the via. The forming step is performed to apply a setting voltage on the lower metal layer, and the upper metal layer is coupled to a ground voltage. The resistive random access memory unit transforms to a low resistive state from a high resistive state. The reverse resetting step is performed to couple the lower metal layer to the ground voltage, and apply a resetting voltage to the upper metal layer. The resistive random access memory unit transforms to a one-way conduction state from the low resistive state. Thus, the fabricating method of the resistive random access memory unit with one-way conduction characteristic of the present disclosure can read and write in one direction. |