專利授權區國立清華大學國際產學營運總中心 Operations Center for Industry Collaboration

搜尋專利授權區

關鍵字

» 新增關鍵字

選單

專利授權區

專利授權區
專利名稱(英)	CHART PATTERN RECOGNITION SYSTEM AND METHOD
專利家族	美國：US-2025-0156501-A1(公開號)
專利權人
發明人	韓傳祥,張智星
技術領域	資訊工程

專利摘要(英)
A chart pattern recognition method includes pre-processing a chart pattern group to be compared to obtain the first chart pattern data to be compared based on time and space; normalizing the first chart pattern data to be compared and the first historical chart pattern data from a database to obtain the second chart pattern data to be compared and the second historical chart pattern data; comparing the second chart pattern data to be compared with the second historical chart pattern data to obtain multiple similarity scores of the second chart pattern data to be compared and the second historical chart pattern data; sorting the multiple similarity scores, the corresponding second chart pattern data to be compared, and the corresponding first historical chart pattern data; and obtaining first historical chart pattern data with a maximum similarity score.

專利摘要(英)

A chart pattern recognition method includes pre-processing a chart pattern group to be compared to obtain the first chart pattern data to be compared based on time and space; normalizing the first chart pattern data to be compared and the first historical chart pattern data from a database to obtain the second chart pattern data to be compared and the second historical chart pattern data; comparing the second chart pattern data to be compared with the second historical chart pattern data to obtain multiple similarity scores of the second chart pattern data to be compared and the second historical chart pattern data; sorting the multiple similarity scores, the corresponding second chart pattern data to be compared, and the corresponding first historical chart pattern data; and obtaining first historical chart pattern data with a maximum similarity score.

聯絡資訊
承辦人姓名	李佳玲
承辦人電話	03-5715131 #62300
承辦人Email	cl.lee@mx.nthu.edu.tw